BEGIN:VCALENDAR
VERSION:2.0
PRODID:Linklings LLC
BEGIN:VTIMEZONE
TZID:Europe/Stockholm
X-LIC-LOCATION:Europe/Stockholm
BEGIN:DAYLIGHT
TZOFFSETFROM:+0100
TZOFFSETTO:+0200
TZNAME:CEST
DTSTART:19700308T020000
RRULE:FREQ=YEARLY;BYMONTH=3;BYDAY=-1SU
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0200
TZOFFSETTO:+0100
TZNAME:CET
DTSTART:19701101T020000
RRULE:FREQ=YEARLY;BYMONTH=10;BYDAY=-1SU
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20230831T095746Z
LOCATION:Schwarzhorn
DTSTART;TZID=Europe/Stockholm:20230627T120000
DTEND;TZID=Europe/Stockholm:20230627T123000
UID:submissions.pasc-conference.org_PASC23_sess114_msa229@linklings.com
SUMMARY:It’s All About That Bayes: Data-Driven Insights into Energy Device
 s without the Black Box
DESCRIPTION:Minisymposium\n\nRachel Kurchin (Carnegie Mellon University)\n
 \nLarge black-box models such as neural networks are exciting and powerful
  tools, but they’re not the only way to learn from data! I will demonstrat
 e Bayesian parameter estimation to extract unprecedented insights from sim
 ple electrical characterization of photovoltaic devices. By running a phys
 ical model many times, spanning the space of properties we wish to fit, th
 en comparing results to the physical measurements, we obtain a posterior d
 istribution over the properties of interest. This approach has numerous ad
 vantages. First, with the democratization of computational power, the trad
 eoff between the researcher time/labor to directly measure these propertie
 s and the computational effort to run many simulations is increasingly fav
 orable. Second, not only are the inferred values of comparable accuracy (a
 nd sometimes superior precision!) to direct physical probes, we can also b
 e confident that they represent the most performance-relevant information 
 about those properties, because we’ve measured them in the device context,
  rather than in a specially prepared sample that may have unrepresentative
  characteristics and measurement conditions. I will demonstrate the abilit
 y not only to extract properties of both bulk materials and interfaces, bu
 t to easily observe relationships between them. Finally, I will discuss on
 going work in utilizing this approach to directly inform/guide device engi
 neering.\n\nDomain: Chemistry and Materials\n\nSession Chair: Michael Herb
 st (EPFL)
END:VEVENT
END:VCALENDAR